Apparatus for radiation analysis

Details Apparatus for radiation analysis Apparatus for radiation analysis

1986-02-21

1989-03-28

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 82, 2503591, G01N 23203

Patent

active

048171220

ABSTRACT:
An apparatus for determining the mass of each of the constituents of a substance to be measured, per unit volume of the same, is disclosed. The apparatus includes a detector disposed at the position to receive energy of back scattered photons produced by a radiation directed on a substance to be measured and systems of measurement, which are smaller in number by one than the kinds of the constituents under investigation, and the signal from the detector is processed for measuring intensity of the energy components unique to each of the constituents.

REFERENCES:
patent: 3626183 (1971-12-01), Berrey et al.
patent: 3843881 (1974-10-01), Barten, Jr. et al.
patent: 4037099 (1977-07-01), Oda et al.
patent: 4200702 (1980-04-01), Fanger et al.
patent: 4558220 (1985-12-01), Evans

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