Apparatus for probing a microwave circuit

Details Apparatus for probing a microwave circuit Apparatus for probing a microwave circuit

1989-06-05

1990-10-23

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 3102

Patent

active

049655140

ABSTRACT:
Apparatus suitable for on-wafer probing of microwave integrated circuits includes a coplanar waveguide carried on one surface of an elongate, tapered, dielectric substrate. The waveguide includes a signal conductor extending substantially the length of the substrate and a pair of ground conductors extending along the opposite edges of the signal conductor. The substrate is bonded to a metal mounting block adjacent one end of an coaxial electrical connector. Conductive bonding material, suitably a conductive epoxy material, is applied along the outer edges of the ground conductors to establish a low impedance ground path between the coaxial waveguide and the metal block.

REFERENCES:
patent: 4365195 (1982-12-01), Stegens
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4749942 (1988-06-01), Sang et al.
patent: 4764723 (1988-08-01), Strid
patent: 4853627 (1989-08-01), Gleason et al.

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