Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-12-10
2000-01-11
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, G01R 3102
Patent
active
060140313
ABSTRACT:
A test structure tests an electronic card having electrical contacts on one face and a chip on the other face. By way of example, the electrical contacts on the card comprise an array of solder balls. The structure comprises a socket for receiving the card such that the electrical contacts of the card face electrical contacts within the socket. The structure further comprises a plate, received over the socket and having at least two ribs which protrude downwardly from one face of the plate and are positioned over the socket to engage a center portion of the chip when the card is received in the socket. The plate also has at least two holes. One of the ribs is positioned between the two holes but does not surround either of the holes. Consequently, forced air can flow downwardly through the holes in the plate, horizontally between the plate and the chip and out of the test structure. Preferably, the two ribs cross each other, and there are four holes in the plate which are arranged in four respective quadrants defined by the cross.
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Ballato Josie
International Business Machines - Corporation
Kobert Russell M.
Samdovitz Arthur J.
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