Apparatus for presenting a sample of material for analysis

Details Apparatus for presenting a sample of material for analysis Apparatus for presenting a sample of material for analysis

2006-08-15

2006-08-15

Toatley, Gregory J. (Department: 2877)

Optics: measuring and testing

Sample, specimen, or standard holder or support

C356S318000

Reexamination Certificate

active

07092083

ABSTRACT:
An apparatus for presenting a sample of material for analysis by a laser-based analyzer comprises a chamber, a first window for admitting laser radiation to the chamber, sample presentation means for presenting a sample such that said laser radiation can impinge upon the sample, and a plurality of second windows (76,78,80,82) for receiving radiation emitted from the sample, said plurality of second windows (76,78, 80,82) adapted to pass radiation emitted from the sample to a plurality of detector means. The apparatus further includes a gas inlet (98) and a gas outlet (100) to enable the atmosphere inside the chamber (52) to be controlled.

REFERENCES:
patent: 4265535 (1981-05-01), Pitt
patent: 4534651 (1985-08-01), Minikane
patent: 62-012844 (1987-01-01), None

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