Apparatus for precision measurement of microwave material...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters

Reexamination Certificate

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Reexamination Certificate

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06864690

ABSTRACT:
Apparatus for the precise positioning of a sample of dielectric material into a cavity resonator system for obtaining dielectric constant, and other measurements. Precision micrometer drive units are provided to move the sample about a vertical axis, to tilt the sample, and to move the sample in X, Y and Z directions. The drive units are positioned on a bearing slide for ease of sample positioning into and out of the cavity. Selected drive units are controllable from a remote location so that the apparatus may be utilized in an environmental chamber whereby measurements may be accomplished without opening the chamber after each measurement. All components of the resonator system, positioning units, cables, etc. are chosen such that they are operable over the desired temperature range of operation.

REFERENCES:
patent: 3691454 (1972-09-01), Hrubesh et al.
patent: 4255702 (1981-03-01), Tricoles et al.
patent: 6605949 (2003-08-01), Heidinger et al.
“The Accurate Measurement of Permittivity by Means of an Open Resonator,” A.L. Cullen and P.K. Yr, Proc. R. Soc. Lond. A. 325, 493-509 (1971).

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