Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-03-02
1983-07-26
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
3501622, 356356, 250237G, G01B 900
Patent
active
043951244
ABSTRACT:
A position encoder including a holographically recorded, single-frequency, phase grating. When this phase grating is illuminated by a quasi-monochromatic spatially coherent light source, it acts as a basic common path interferometer and constitutes a highly efficient source of high contrast, stable, interference fringe patterns. In a position encoder application, a carrier moves the grating in a plane that is orthogonal to an axis from the light source. Motion of the carrier is detected as the fringe pattern moves past detecting means thereby to sense motion and provide position information in the form of electrical signals.
REFERENCES:
patent: 3738753 (1973-06-01), Huntley
patent: 3996468 (1976-12-01), Jablonowski
patent: 4025197 (1977-05-01), Thompson
patent: 4091281 (1978-05-01), Willhelm et al.
patent: 4176276 (1979-11-01), Kaul et al.
Randwal Instrument Co., Inc.
Rosenberger R. A.
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