Apparatus for p-type doping of semiconductor structures formed o

Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus

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118723ME, C30B 3500

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active

055115098

ABSTRACT:
A method and apparatus (10) for forming a p-doped layer (68, 80, 92) of Group II and Group VI elements by molecular beam epitaxial process in which a nitrogen dopant is introduced as the layer (68, 80, 92) is being grown. In one embodiment, molecular nitrogen is passed through a plasma generator (46) for convening it to activated nitrogen, and the activated nitrogen is conducted through an elongated guide tube (50) toward the substrate (66) upon which a Group II-Group VI layer (68, 80, 92) is being grown. In one embodiment, an n-type dopant source (72) is also provided, the apparatus (10) being operable for forming electrical devices (86, 88) having successive layers (78, 80, 90, 92, 94) of differing electrical characteristics.

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"Kinetics of molecular-beam epitaxial HgCdTe growth"-Koestner, et al., J. Vac. Sci Tech vol. A6(4), Jul./Aug. 1988, pp. 2834-2839.
"The doping of mercury cadmium telluride grown by molecular-beam epitaxy"; Boukerche, et al.; J. Vac. Sci Tach vol. A6(4), Jul./Aug. 1988 pp. 2830-2833.

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