Apparatus for optically measuring the three-dimensional surface

Details Apparatus for optically measuring the three-dimensional surface Apparatus for optically measuring the three-dimensional surface

1987-07-17

1989-08-15

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250213VT, 356376, G01N 2186

Patent

active

048577480

ABSTRACT:
An apparatus for optically measuring a three-dimensional surface shape and inner structure of a three-dimensional object without destruction of the object. When a light pulse having a short pulse width is applied to the object, there are observed a flux of light pulses reflected from or transmitted through the object which has information on the three-dimensional surface shape and inner structure of the object. This apparatus optically measures and analyzes in the order of a picosecond the intensity distribution of the light pulses from the object with time and space, to thereby obtain a complete three-dimensional image of the object.

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patent: 4542290 (1985-09-01), Tan et al.
Richard Lear, "Fast Imaging Applications in the Nuclear Test Program", 2/84; pp. 497-503.
H. R. Taylor, "Recording Flash X-Ray Burst Times with Scintillation Crystals," 11/71; pp. 1627-1629.
L. G. Cohen, "Interferometric Measurements of Minimum Dispersion Spectra in Short Lengths of Single-Mode Fibre".
A. Barthelemy, "New Method for Precise Characterization of Multimode Optical Fibers," Mar. 18, 1982; pp. 247-250.

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