Apparatus for obtaining dose uniformity in plasma doping (PLAD)

Coating apparatus – Gas or vapor deposition – With treating means

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20429806, C23C 1600

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active

057118124

ABSTRACT:
An apparatus for improving dose uniformity in the PLAsma Doping (PLAD) ion implantation of a target material is described. By providing means for simultaneously biasing both the electrode, upon which the target is disposed, and a separately biasable concentric structure introduced about the electrode and sufficiently close to the target, together with means for adjustable bias variation between the electrode and the structure one can sufficiently adjust the shape of the implantation plasma, e.g. induced electric field and plasma sheath thickness, in order to effectively provide a uniform dose distribution during PLAD ion implantation processes.

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Susan B. Felch et al., "Studies of Ultra-Shallow p+-n Junction Formation Using Plasma Doping", Ion Implantation Technology--94 (1995), pp. 981-984.
T. Sheng et al., "Characteristics of a Plasma Doping System For Semiconductor Device Fabrication", Journal of Vacuum Science Technology B 12(2), Mar./Apr. 1994, pp. 969-972.
Nathan W. Cheung, "Plasma Immersion Ion Implantation For ULSI Processing", Nuclear Instruments and Methods in Physics Research B55 (1991), pp. 811-820.

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