Apparatus for non-destructively testing the voltage characterist

Details Apparatus for non-destructively testing the voltage characterist Apparatus for non-destructively testing the voltage characterist

1974-12-16

1976-06-22

Mullins, James B.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158D, G01R 3122

Patent

active

039654206

ABSTRACT:
A non-destructive test apparatus includes current limiting means whose current conducting level is set according to the transistor characteristics under test. The current limiting means is in series with the collector-emitter electrodes of the transistor under test. A test voltage is placed across the series-connected current limiting means and test transistor. The test transistor is rendered non-conductive in accordance with the characteristics being tested. If the transistor enters a voltage breakover region known as "snap-back," destructive failure of the transistor is imminent causing a change in voltage across the current limiting means. Upon this change in voltage being sensed, destructive power is directed away from the transistor under test.

REFERENCES:
patent: 3054954 (1962-09-01), Boscia et al.
patent: 3371276 (1968-02-01), Schiff
patent: 3401338 (1968-09-01), Bolvin
patent: 3535639 (1970-10-01), Lunden

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