Apparatus for non-destructive testing of dielectric/magnetic mat

Details Apparatus for non-destructive testing of dielectric/magnetic mat Apparatus for non-destructive testing of dielectric/magnetic mat

1993-03-19

1995-02-14

Wieder, Kenneth A.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324226, 324262, 324642, 324316, 324317, G01N 2772, G01R 3300

Patent

active

053898753

ABSTRACT:
A dielectric probe, of the type in which an electromagnetic wave is reflected from a dielectric/magnetic structure and spectrum analyzed, further includes a coil for applying a magnetic field to the structure as the wave is being reflected. Information about the intrinsic electromagnetic properties, integrity and structure of the material is obtained by comparing the reflected spectra for both the magnetic field on and off conditions.

REFERENCES:
patent: 2597149 (1952-05-01), Kahan
patent: 3371271 (1968-02-01), Takeuchi
patent: 3585494 (1971-06-01), Bozanic
patent: 3884076 (1975-05-01), Studer
patent: 4023412 (1977-05-01), Luke
patent: 4087745 (1978-05-01), Kennedy
patent: 4593248 (1986-06-01), Hyde
patent: 4605893 (1986-08-01), Braslau
patent: 4607521 (1986-08-01), Saito
patent: 4851762 (1989-07-01), Kim

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