Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Patent
1992-04-03
1993-11-16
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
324262, 336200, G01N 2790, G01R 3312
Patent
active
052627225
ABSTRACT:
An apparatus for near surface, nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array. Such structures of this type, generally, employ an ultra-thin, flexible, film-like, multi-layer eddy current probe array which is adapted to provide routine inspection of conductive parts while also providing improved signal integrity, signal transmission and isolation.
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"Eddy Current Printed Circuit Probe Array: Phase I," T. G. Kincaid, Signametrics Report No. 9, Sep. 12, 1987 (also appeared as an appendix to a GE final report).
"Eddy Current Printed Circuit Probe Array: Phase IIA," T. G. Kincaid, Signametrics Report No. 10, Dec. 29, 1988 (also appearing in a GE Final Report No. 2880582Y20XG, "Eddy Current Technology Department," Jan. 1989 as an appendix).
"Flexible Substrate Eddy Current Coil Arrays," Y. D. Krampfner and D. D. Johnson, Review of Progress in Quantitative Nondestructive Evaluation, vol. 7A, pp. 471-478, 1988.
Charles Richard J.
Hedengren Kristina H. V.
Kornrumpf William P.
Edmonds Warren S.
General Electric Company
Strecker Gerard R.
Webb II Paul R.
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