X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1988-08-12
1990-09-18
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378145, G21K 106
Patent
active
049583638
ABSTRACT:
A multilayer x-ray reflector or reflectors are used with a source of radiation for narrow bandwidth or dual energy radiographic imaging applications. In one aspect, a unique multilayer design permits two distinct x-ray energies of narrow bandwith to be reflected at the same incident angle for use in dual energy applications. In another aspect, several multilayer reflectors are employed in a slit scanning system. In yet another aspect, an elongated radiation source and a multilayer x-ray reflecting structure are combined to provide an x-ray or gamma ray source.
REFERENCES:
patent: 4045672 (1977-04-01), Watanabe
patent: 4203037 (1980-05-01), Gur et al.
patent: 4366574 (1982-12-01), Hill
patent: 4675889 (1987-06-01), Wood et al.
patent: 4737973 (1988-04-01), Ogawa et al.
patent: 4785470 (1988-11-01), Wood et al.
Underwood, J. H. et al., Layered Synthetic Microstructure as Bragg Diffractor for X-Rays and Extreme Ultraviolet: Theory and Predicted Performance, Applied Optics, vol. 20, No. 17, 9-1-81.
E. Spiller, A. Segmuller, J. Rife, R. Haelbich; "Controlled Fabrication of Multilayer Soft X-Ray Mirrors," App. Phys. Lett., 37 (11): 1048 (1980).
A. Vinogradov and B. Zeldovich, "X-Ray and UV Multilayer Mirrors: Principles and Possibilities," App. Optics, vol. 16(1): 89 (1977).
Barnes et al., Med. Phys., 6(3): 197 (1979).
King et al., Med. Phys., 10(1): 4(1983).
Rudin et al., Med. Phys., 9(3): 385 (1982).
Macovski et al., Comput. Bio. Med., 6: 325 (1976).
Lehmann et al., Med. Phys., 8(51): 659 (1981).
A. Thelen, Multilayer Filters with Wide Transmittance Bands, JOSA, vol. 53, No. 11, 1266-1270 (1963).
J. Underwood et al., The Renaissance of X-Ray Optics, Physics Today, vol. 37, No. 4, pp. 44-52 (Apr., 1984).
E. Spiller Evaporated Mulitlayer Dispersion Elements for Soft X-Rays, A.I.P. Conference Proceedings, No. 75, pp. 124-130 (1981).
A. E. Rosenbluth et al., The Reflecting Properties of Soft X-Ray Multilayers, A.I.P. Conference Proceedings No, 75, pp. 280-285 (1981).
D. J. Nagel et al, Bragg Diffractors with Graded-Thickness Multilayers, Nuclear Instruments and Methods, vol. 195, pp. 63-65 (1982).
J. DuMond et al., An X-Ray Method of Determining Rates of Diffusion in the Solid State, Journal of Applied Physics, vol. 11, pp. 357-365 (May, 1940).
H. D. Zeman et al., Implementation of Digital Subtraction Angiography with a Synchrotron X-Ray Beam, I.E.E.E. Transactions on Nuclear Science, vol. NS-29, No. 1 (Feb., 1982).
D. H. Bilderback et al., Design of Doubly Focusing, Tunable (5-30 KeV), Wide Bandpass Optics Made from Layered Synthetic Microstructures, Nuclear Instruments and Methods, vol. 208, pp. 251-261 (1983).
Barbaric Zoran L.
Nelson Robert S.
Zach Reuven D.
LandOfFree
Apparatus for narrow bandwidth and multiple energy x-ray imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for narrow bandwidth and multiple energy x-ray imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for narrow bandwidth and multiple energy x-ray imaging will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1577150