Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1998-01-30
2000-12-05
Assouad, Patrick
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
361164, 361690, 374135, G01K 102
Patent
active
061578975
ABSTRACT:
A temperature IC is mounted to a card mounted within an electronic apparatus for monitoring airflow rate around the card to provide an alarm signal. The temperature IC includes a first IC including a temperature sensor and a second IC disposed downstream of the first IC. The second IC includes a temperature sensor and a resistor as a heating element. The second IC includes a first arithmetic unit that forms the difference in temperature out of two inputs of the temperature sensors, and a second arithmetic unit that determines thermal resistance of the second IC out of the difference in temperature and the quantity of heat released from the resistor. A memory stores date indicative of a relation between values of airflow rate and values of thermal resistance. A third arithmetic unit is provided to refer the stored data using the determined thermal resistance to find airflow rate.
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Assouad Patrick
NEC Corporation
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