Apparatus for monitoring thickness variations in a film web

Details Apparatus for monitoring thickness variations in a film web Apparatus for monitoring thickness variations in a film web

1985-12-11

1990-09-25

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

049589300

ABSTRACT:
An optical inspection apparatus using a polychromatic source to generate a channeled spectrum for measuring the variations in the thickness of a thin transparent web as the web moves on-line with respect to an optical inspection station.

REFERENCES:
patent: 3319515 (1967-05-01), Flournoy
patent: 3354311 (1967-11-01), Vali et al.
patent: 3494698 (1970-02-01), Neumann
patent: 3578866 (1971-05-01), Kohler et al.
patent: 3639063 (1972-02-01), Krogstad et al.
patent: 3720471 (1973-03-01), Kasahara et al.
patent: 4254337 (1981-03-01), Yasujima et al.
patent: 4408123 (1983-10-01), Sichling et al.
patent: 4548502 (1985-10-01), Chandra et al.

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