Apparatus for monitoring optical path differences utilizing an e

Details Apparatus for monitoring optical path differences utilizing an e Apparatus for monitoring optical path differences utilizing an e

1986-11-05

1988-08-30

Richardson, Robert L.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Radiation beam modification of or by storage medium

369 99, 369112, 356358, 358342, G11B 700

Patent

active

047681829

ABSTRACT:
The optical path difference between two reflecting surfaces of an etalon 2 is monitored by directing a light beam B onto the etalon, directing the reflected beam Ba from the etalon onto an optical reference wedge 3 and directing the reflected beam Bb from the wedge onto a linear photo-detector array 4. The position along the array 4 of a peak of light intensity represent the location of an interference maximum and corresponds to reflection of light at that position along the length L of the wedge 3 at which the optical path difference of the wedge equals the optical path difference of the etalon being measured. The etalon 2 may comprise a data carrier encoded by variations in its relief (and therefore in its optical path difference), which data carrier may comprise a rotatable disc and the apparatus may comprise an optical head movable radially of the disc to read different concentric tracks.

REFERENCES:
patent: 4558952 (1985-12-01), Kulesh et al.

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