Apparatus for microscopic imaging of electrical and magnetic pro

Details Apparatus for microscopic imaging of electrical and magnetic pro Apparatus for microscopic imaging of electrical and magnetic pro

1996-02-12

1999-04-13

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

Magnetometers

250330, 2503381, 324226, 324235, 324240, 324261, 324262, 324457, 324750, 382147, 505160, 505842, 505846, 505849, G01R 33035, G01R 3100, G01N 2772, G01J 500

Patent

active

058942203

ABSTRACT:
A cryogenic apparatus for microscopy of physical properties of an object including a thin, stiff, transparent substrate or window within the outer wall of the vacuum space of a dewar and a cryogenic sensor within the vacuum space and spaced very close distances to the window. This construction allows for positioning a sample for measurement outside of the vacuum space, at room temperature or higher and for microscopy of physical properties of the sample by monitoring the output from the cryogenic sensor as it is scanned along the surface of the sample.

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