Apparatus for measuring two-dimensional displacement

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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C356S521000

Reexamination Certificate

active

10935172

ABSTRACT:
An apparatus for measuring a two-dimensional displacement is disclosed and includes a laser light source, a collimator lens, a beam splitter, a plurality of staggered conjugate optic lens and a plurality of interference optical dephasing modules. The laser light source provides a laser light incident on the collimator lens to generate collimated laser beams. Each of the collimated laser beams are incident on the beam splitter to be separated into two incident beams and incident on a two-dimensional diffraction unit to generate a plurality of first diffracted beams and a plurality of second-order diffracted beams. The staggered conjugate optic lens are used to reflect the first diffracted beams so that the first diffracted beams return to the two-dimensional diffraction unit to generate a plurality of second diffracted beams where the second diffracted beams and the second-order diffracted beams generated as a result of the first diffraction of the beams stagger.

REFERENCES:
patent: 5104225 (1992-04-01), Masreliez
patent: 5204524 (1993-04-01), Ichikawa et al.
patent: 5424833 (1995-06-01), Huber et al.
patent: 5530543 (1996-06-01), Hercher
patent: 6744520 (2004-06-01), Chang et al.
patent: 6771377 (2004-08-01), Jones et al.

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