Apparatus for measuring time variant device impedance

Details Apparatus for measuring time variant device impedance Apparatus for measuring time variant device impedance

1982-10-20

1984-11-06

Krawczewicz, Stanley T.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

324 57R, G01R 2700

Patent

active

044814640

ABSTRACT:
An apparatus is disclosed which can accurately measure time variant non-ideal device impedance without unwanted delays caused by internal filters. A novel scheme is used which reduces both noise and drift so that the measurement of time variant capacitance and conductance can be made with increased precision for accurately determining such semiconductor characteristics as carrier lifetime and trap level.

REFERENCES:
Maeda: "An Automatic Precision 1 MHZ Digital LCR Meter"--hp Journal Mar. 74, pp. 2-9.
Hashimoto: "An Automatic Wide Range Digital LCR Meter" hp Journal Sep. 76, pp. 9-15.

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