Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-01-24
1987-05-26
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
364560, G01B 1124
Patent
active
046680942
ABSTRACT:
A shape measuring apparatus includes a first light source for illuminating a solid object in a proper place through a first slide, a second light source for illuminating the object through a second slide and an observation plane permitting the surface of the object to be observed through a focal point. Each of the first and second slides, contains slit lines. When the first and second light sources are lighted, the slit lines of the first and second slide are projected, in an intersecting pattern, on the surface of the object. A projection grating is formed on the surface of the object and is observed, as a projection grating, in the observation plane. The space coordinates of any one arbitrary point of a grating point array on the projection grating are determined by determining a light beam projecting the grating point after it has left the first light source, determining a light beam projecting the grating point after it has left the second light source, determining a light beam, through the focal point, to permit the grating point corresponding to the projection grating point to be observed in the observation plane and determining the space coordinates of the intersection of at least two of the three light beams. Similarly, the space coordinates of other grating points on the projection grating are sequentially determined, thus measuring the shape of the object.
REFERENCES:
patent: 3619065 (1971-11-01), Agnew
patent: 3814521 (1974-06-01), Free
patent: 3952150 (1976-04-01), Gerardin et al.
patent: 4175862 (1979-11-01), DiMatteo et al.
Fujita Hiroyuki
Matsumoto Goro
Shimizu Koichi
Mitsubishi Jidosha Kogyo Kabushiki Kaisha
Rosenberger R. A.
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