Apparatus for measuring the thickness of thin layers

Details Apparatus for measuring the thickness of thin layers Apparatus for measuring the thickness of thin layers

1992-04-23

1993-03-16

Haroian, Harry N.

Geometrical instruments

Distance measuring

Single contact with a work engaging support

33542, 33544, G01B 512

Patent

active

051932890

ABSTRACT:
A long arm bears a probe at its end and is arranged in such a way that it can swivel by small angular amounts. This low-mass and slowly movable system is protected by a protective device from which it emerges only partly during the measuring operation. A lowering device which both decouples and entrains, interacts with a damping element. An article to be measured is pushed onto the protective device, an actuating device is pressed and the probe slowly emerges from the protective device and ultimately rests in a defined manner and with adequately low force on a layer of the article.

REFERENCES:
patent: 3307266 (1967-03-01), Miserocchi

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