Apparatus for measuring the thickness of a moving film utilizing

Details Apparatus for measuring the thickness of a moving film utilizing Apparatus for measuring the thickness of a moving film utilizing

1994-09-12

1995-12-05

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, G01B 902

Patent

active

054734320

ABSTRACT:
An apparatus for measuring the thickness of a moving film. The apparatus utilizes a low coherence light source to generate a light signal that is directed at the film with the aid of an optical fiber and lens. A portion of the light reflected from the film is collected and coupled to an interferometer to generate an interference light signal comprising the coherent sum of first and second light signals. The first light signal comprises the collected light signal, and the second light signal comprises the collected light signal offset in time with respect to the first light signal. The offset is varied in time and the interference light signal intensity is measured for the various time offsets. In the preferred embodiment, the numerical aperture of the light focused onto the film may be varied to optimize the light collection for the specific properties of the carriage system used to move the film. The offset is preferably measured by adding a reference light signal with the collected light signal and then detecting the interference pattern generated in the interferometer by the reference light signal.

REFERENCES:
patent: 3319515 (1967-05-01), Flournoy
patent: 5341205 (1994-08-01), McLandrich et al.
R. A. Patten, "Michelson Interferometer as a Remote Gauge", Applied Optics, Dec. 1971, vol. 10, No. 12.
P. A. Flournoy, R. W. McClure, and G. Wyntjes, "White-Light Interferometric Thickness Gauge", Applied Optics, Sep. 1972, vol. 11, No. 9.

Affiliated with

Also associated with

Rating

Apparatus for measuring the thickness of a moving film utilizing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for measuring the thickness of a moving film utilizing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for measuring the thickness of a moving film utilizing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1377749