X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1991-01-17
1992-04-07
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 54, 378206, 250308, 2503591, 2503601, 2504911, 250223R, G01N 2316
Patent
active
051034719
ABSTRACT:
An apparatus for measuring the thickness of a coating on an elongate strip of material which moves along a predetermined path from a first location to a second location. The apparatus includes a measuring device, at least a portion thereof being mounted on a shuttle for movement parallel with the elongate strip. The shuttle is mounted on a support frame for movement back and forth along the frame. The shuttle is further provided with a target-spotting device. A drive extends between the shuttle and the support frame for reciprocating the shuttle along the frame. The drive is responsive to either an on-target signal or an error signal received from the target-spotting device for driving the shuttle from the first location towards the second location to initially position the target-spotting device in registry with the target when an error signal is being received and to subsequently maintain the target-spotting device in substantial registry with the target when an on-target signal is being received so that the measuring device can be maintained in registry with a measurement site having a specific placement relative to the target.
REFERENCES:
patent: 3621259 (1971-11-01), Boissevain
patent: 4383172 (1983-05-01), Holler et al.
patent: 4451732 (1984-05-01), Spongr et al.
patent: 4656357 (1987-04-01), Spongr et al.
patent: 4678915 (1987-07-01), Dahlquist et al.
patent: 5021666 (1991-06-01), Reber
Fakharzadeh Masood
Spongr Jerry J.
Howell Janice A.
Porta David P.
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