Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1982-06-21
1984-10-30
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
250227, G01B 1100
Patent
active
044797176
ABSTRACT:
A source of light (F1, 34) directs a light beam (35) towards an object. A photoelectrical measuring system (39) includes three measurement detectors (40, 41, 42) having respective reception fields (44, 45, 46). These fields overlap partially, and all of them share a volume of space in common with the beam (35). A reference photoelectrical system (F2, 36) detects light diffused by an object anywhere in said common volume. A processing system determines the distance of the object in said common field as a function both of which of the measurement detectors is detecting light diffused by the object and of the ratio between the measurement signal detected thereby and the reference signal from the reference system. The apparatus may be used to equip the pincers of an industrial robot.
REFERENCES:
patent: 3327584 (1967-06-01), Kissinger
patent: 3771873 (1973-11-01), Tourret
patent: 3778157 (1973-12-01), Brelot et al.
patent: 3792928 (1974-02-01), Poilleux
patent: 4247764 (1981-01-01), Kissinger
patent: 4373805 (1983-02-01), Mallison
Advances in Test Measurement, vol. 5, Proceedings of the 5th Annual ISA Test Measurement Symposium, N.Y., Oct. 28-31, 1968, Instr. Soc. of Am. Pittsburgh (US) R. B. Zipin: "Non-Contact Optical Fiducial" pp. 68-547; 1-5, FIGS. 1, 2, 3.
Compagnie Industrielle des Lasers Cilas Alcatel
Rosenberger R. A.
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