Apparatus for measuring the optical characteristics of an optica

Details Apparatus for measuring the optical characteristics of an optica Apparatus for measuring the optical characteristics of an optica

1983-08-01

1987-02-10

Rosenberger, R. A.

Optics: measuring and testing

Lens or reflective image former testing

For optical transfer function

356127, G01B 900

Patent

active

046419616

ABSTRACT:
In an apparatus for measuring the optical characteristics of an optical system to be examined a light source determines a reference optical axis and generates a light beam that is passed through the optical system to be examined along the reference optical axis. A mask partly transmits the light beam therethrough and has a pattern comprising at least one straight line disposed off the reference optical axis in the light beam, the straight line of the pattern extending in a predetermined direction in a plane substantially orthogonal to the reference optical axis. A photosensitive detector receives the light beam passed through the optical system to be examined and the mask. The detector is fixedly disposed relative to the mask and has a substantial length in a direction substantially orthogonal to the reference optical axis and the straight line of the pattern. The detector produces an electrical signal indicative of the position of the pattern of the mask projected onto the detector in the direction of the length of the detector. A rotator provides relative rotation about the reference optical axis between the light beam passed through the optical system to be examined and the mask. A signal processor processes the electrical signal and finds the refractive characteristic of the optical system to be examined. -

REFERENCES:
patent: 2640392 (1953-06-01), Freeman
patent: 4410268 (1983-10-01), Tamaki

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