X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-01-29
2008-01-29
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S062000
Reexamination Certificate
active
07324627
ABSTRACT:
An apparatus for measuring the momentum transfer spectrum of elastically scattered X-ray quanta includes an anode having a focus extended in Y-direction which emits X-radiation in the X-direction, a primary collimator extending in the Y-direction which allows through only X-radiation aimed at a single isocenter, wherein the isocenter is the originating point of a Cartesian coordinates system, an examination area, a scatter collimator arranged between said examination area and the isocenter and configured to allow through only scattered radiation from an object introduced in said examination area, wherein the radiation is emitted at a fixed angle of scatter (Θ), and a detector. The X-component of a scatter voxel of the object is imaged onto the Z-component of the detector, and the detector is located in the Y-Z plane, distanced from the Z-axis, and developed as a two-dimensional pixellated detector having a plurality of energy-resolving detector elements.
REFERENCES:
patent: 6054712 (2000-04-01), Komardin et al.
patent: 6442233 (2002-08-01), Grodzins et al.
patent: 2003/0031295 (2003-02-01), Harding
patent: 1 241 470 (2003-09-01), None
patent: 1347287 (2004-07-01), None
Armstrong Teasdale LLP
GE Homeland Protection Inc.
Hyun, Esq. Eugene
Song Hoon
LandOfFree
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