Optics: measuring and testing – Lamp beam direction or pattern
Patent
1990-04-26
1991-11-12
Rosenberger, Richard A.
Optics: measuring and testing
Lamp beam direction or pattern
G01J 100
Patent
active
050642847
ABSTRACT:
A method and apparatus for determining the quality of a multimode laser beam (10). In the preferred embodiment, the apparatus includes a lens (32) for creating a transformed or imaged waist from the input beam. The location of the transformed beam waist and its diameter are then determined. These steps can be carried out by chopping the beam using a rotating hub (14) having apertures (36,38) for selectively passing the beam. Preferably, one of the apertures has a pair of 45.degree. knife edges (40,42). The transmission of the beam past the knife edge is monitored by a detector (30). In operation, the lens focal position is varied while the transmission of the beam past the knife edge is monitored in order to locate and measure the diameter of the transformed waist. The diameter of the beam at one other known location is measured. A processor then calculates beam quality by fitting these measurements to a mathematical model. Once the quality of the beam is calculated, the location of the original beam waist and its diameter can be derived. Once all of the beam parameters are derived, the propagation characteristics of the beam can be predicted. In the preferred embodiment, the transformed beam waist is located by taking incremental measurements of beam diameter, at both the front and rear planes of the hub, as the lens is moved a distance at least a great as the diameter of the hub. The diameter measurements are spliced together by the processor to provide an axial profile of the beam over a distance twice as large as the diameter of hub. This data can then be analyzed to find the minimum which corresponds to the location of the transformed beam waist.
REFERENCES:
patent: 3617755 (1971-11-01), Arnaud
Freiberg et al., "Properties of Low Order Transverse Modes in Argon Ion Lasers", Applied Optics, vol. 8, No. 2 (Feb. 1969) pp. 355-362.
Fleischer et al., "Gaussian Beam Profiling: How and Why", Lasers and Optronics (May 1987) pp. 61-64.
Lavi et al., "Generalized Beam Parameters and Transformation Laws for Partially Coherent Light", Applied Optics (vol. 27, No. 17) (1 Sep. 1988) pp. 3696-3703.
Johnston, Jr. Thomas F.
Williams Gerald H.
Coherent Inc.
Rosenberger Richard A.
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