Apparatus for measuring the electrical resistance of a test spec

Details Apparatus for measuring the electrical resistance of a test spec Apparatus for measuring the electrical resistance of a test spec

1990-02-13

1991-04-09

Wieder, Kenneth

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324603, 324719, 324724, G01R 2708

Patent

active

050068091

ABSTRACT:
An apparatus for measuring the resistance of a test specimen includes an insulated-gate-bipolar-transistor (IGBT transistor) which is provided for applying a test current to the test specimen. A voltage measuring unit is provided including a serial connection of a voltage measuring device and an MOS transistor. A current measuring device is provided for measuring the test flowing through the test specimen. The voltage measured by the voltage measuring unit is used to compensate for the voltage drop across the IGBT transistor when calculating the resistance of the test specimen.

REFERENCES:
patent: 3495164 (1970-02-01), Dauphinee
patent: 3609539 (1971-09-01), Gunthert
patent: 3946309 (1976-03-01), Roughton
patent: 3974443 (1986-08-01), Thomas
patent: 3978472 (1976-08-01), Jones
patent: 4050017 (1977-09-01), Paufve
patent: 4179652 (1979-12-01), Davis
patent: 4706015 (1987-11-01), Chen
patent: 4887025 (1989-12-01), ReFiorentin et al.

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