Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-12-21
1996-12-31
Gonzalez, Frank
Optics: measuring and testing
By polarized light examination
With light attenuation
2502014, 2502016, 2502012, G01B 1124, G02B 704, G02B 2740
Patent
active
055899404
ABSTRACT:
A curvature measuring device (10) for measuring the curvature of an object (14) without contacting object (14) includes a moveable frame (20) and a reflector (28) for reflecting light incident thereupon. A reflector (28) is connected and rotatable with respect to moveable frame (20). An electro-optical device (42) is connected and moveable with respect to moveable frame (20). Electrooptical device (42) includes a light transceiver (52) for transmitting an incident beam of light (54) onto reflector (28) and for receiving a reflected beam of light (56) reflected by reflector (28). Electro-optical device (42) generates a focus signal related to a degree that reflected beam of light (56 ) is received by electro-optical device (42). A controller (90) calculates the curvature of object (14 ) by adjusting a position of moveable frame (20), an angular position of reflector (28), and focus position of electro-optical device (42). Light transceiver (42) can include a bifurcated fiber optic cable have a first bundle coupled to a light emitting diode and a second bundle coupled to a photodiode. The controller (90) aligns incident beam of light (54) to form a 90.degree. angle with surface (12) of object (14). Controller (90) employs a focus signal generated by the electro-optical device (42) in a closed-loop fashion to adjust a frame positioning device (22), an angular positioning device (30), and a focus positioning device (40).
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Denson-Low Wanda K.
Eisenberg Jason D.
Gonzalez Frank
Hughes Electronics
Sales Michael W.
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