Apparatus for measuring surface movement of an object that is su

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356357, 356432, 73655, G01B 902

Patent

active

056233078

ABSTRACT:
A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.

REFERENCES:
patent: 3601490 (1971-08-01), Erickson
patent: 3694008 (1972-09-01), Gallagher et al.
patent: 3978713 (1976-09-01), Penney
patent: 4144767 (1979-03-01), Kaule et al.
patent: 4201473 (1980-05-01), Domenicali et al.
patent: 4225240 (1980-09-01), Balasubramanian
patent: 4255971 (1981-03-01), Rosenewaig
patent: 4468551 (1984-08-01), Neiheisel
patent: 4469450 (1984-09-01), DiVincenzo
patent: 4522510 (1985-06-01), Rosenewaig et al.
patent: 4539846 (1985-09-01), Grossman
patent: 4541280 (1985-09-01), Cielo et al.
patent: 4622202 (1986-11-01), Yamada et al.
patent: 4633715 (1987-01-01), Monchalin
patent: 4655608 (1987-04-01), Goss et al.
patent: 4659224 (1987-04-01), Monchalin
patent: 4762425 (1988-08-01), Shakkottai et al.
patent: 4966459 (1990-10-01), Monchalin
patent: 5052661 (1991-10-01), Dunlay et al.
patent: 5080491 (1992-01-01), Monchalin
patent: 5136172 (1992-08-01), Narata et al.
patent: 5137361 (1992-08-01), Heon et al.
Polarization Interferometers, Mallick, Wiley-Interscience, pp. 45-67, Dec. 1990.
Equal-Path, Phase-Shifting, Sample-Point Interferometer Sensitivity to vibration and air turbulence would be reduced NASAS Jet Propulsion Laboratory, Pasadena, CA--NASA Tech Briefs, Apr. 1991 p. 61.
New Sensors for Ultrasound: Measuring Temperture Probe Files, Materials and Standards, vol. 10, No. 8 Aug. 1970.
The Ultrasonic Thermometer--Construction Application, and Operating Experiences High Temperature-High Pressures, 1972, vol. 4, No. 4.
McGraw-Hill Encyclopedia of Science & Technology, 1987 edition, vol. 9, pp. 289-297.
Brochure from Zygo Corp. Mark IVEP Interferometer System, 1990.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for measuring surface movement of an object that is su does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for measuring surface movement of an object that is su, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for measuring surface movement of an object that is su will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-344779

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.