Apparatus for measuring reflectivity

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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356445, G01N 2186

Patent

active

048312762

ABSTRACT:
In order to insure a high degree of precision of measurement with a simple structure, the apparatus for measuring reflectivity employs an objective lens, a half-mirror disposed rearwardly of the objective lens and a light source means disposed on one of the optical paths so split by the half-mirror for emitting an annular bundle of light. A fine aperture stop is disposed on the other optical path so split by the half-mirror. A light-responsive device is disposed rearwardly of the fine aperture stop, a memory is coupled to the light-responsive device and a mathematical operation device is connected to the memory. An indicating device is connected to the mathematical operation device. An annular bundle of light is collected onto an examination surface via the half-mirror and the objective lens, and that the reflection light produced at the examination surface is caused to impinge onto the light-responsive device via the objective lens, the half-mirror and the fine aperture stop. In order to eliminate harmful reflection light coming from the surface of the objective lens, and to prevent a loss of amount of light at the half-mirror, polarizers are disposed one on the light source side and the other on the light-responsive device side of the half-mirror in such a way that their polarization planes cross each other at right angles, and that a 1/4 wave plate is provided between the objective lens and the examination surface.

REFERENCES:
patent: 3396266 (1968-08-01), Max et al.
patent: 3874799 (1975-04-01), Isaacs et al.
patent: 4062623 (1977-12-01), Suzuki et al.
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patent: 4198571 (1980-04-01), Sheppard
patent: 4199219 (1980-04-01), Suzki
patent: 4368982 (1983-01-01), Van Arnam et al.
patent: 4636080 (1987-01-01), Feldman

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