Apparatus for measuring reflectivities of resonator facets of se

Details Apparatus for measuring reflectivities of resonator facets of se Apparatus for measuring reflectivities of resonator facets of se

1985-09-18

1987-04-28

LaRoche, Eugene R.

Optics: measuring and testing

Of light reflection

356124, G01N 2147

Patent

active

046609830

ABSTRACT:
An apparatus for measuring the reflectivities of the resonator facets of a semiconductor laser when the facets are covered with a protective coating of dielectric material or the like, which comprises photodetector means for individually measuring the laser light powers from both facets of the resonator, reflector means for reflecting the laser light from one of the facets back to the laser, shutter means openable or closable at a position to block the laser light reflected from the reflector means, and photodetector means for measuring the power of the reflected laser light.

REFERENCES:
patent: 4156571 (1979-05-01), Ljung

Affiliated with

Also associated with

Rating

Apparatus for measuring reflectivities of resonator facets of se does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for measuring reflectivities of resonator facets of se, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for measuring reflectivities of resonator facets of se will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-473974