Apparatus for measuring Q-quality of oscillatory circuit compone

Details Apparatus for measuring Q-quality of oscillatory circuit compone Apparatus for measuring Q-quality of oscillatory circuit compone

1977-09-29

1979-01-23

Krawczewicz, Stanley T.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 2700

Patent

active

041363132

ABSTRACT:
An apparatus for measuring the Q-quality of oscillatory circuit components includes a control unit electrically coupled to a high-frequency generator connected to a frequency modulator having its output connected to a measuring unit. The measuring unit is electrically coupled to the oscillatory circuit components whose Q-quality is to be measured. The apparatus includes a unit for producing the first frequency derivative of the amplitude-frequency response of the oscillatory circuit, said unit being connected to a third control unit, and a unit for producing the second frequency derivative of the amplitude-frequency response of the oscillatory circuit, said unit being also connected to said third control unit. The third control unit is connected to a peak detector, to an electronic switch, to a first and second memory units, and to the drive input of the frequency modulator.
The proposed apparatus offers high accuracy of measuring the Q-quality and is completely free of errors due to the frequency dependence of the transfer ratios of the measuring unit coupling elements.

REFERENCES:
patent: 3824458 (1974-07-01), Martyashin et al.
patent: 3843925 (1974-10-01), Martyashin et al.
patent: 3846699 (1974-11-01), Martyashin et al.
patent: 3848186 (1974-11-01), Martyashin et al.

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