Electricity: measuring and testing – Particle precession resonance – Spectrometer components
Patent
1994-10-04
1996-12-17
Tokar, Michael
Electricity: measuring and testing
Particle precession resonance
Spectrometer components
324300, G01R 3320
Patent
active
055857221
ABSTRACT:
An apparatus for measuring physical properties of micro area which has an object to measure physical properties from a micro area on an atomic scale on the surface of a test sample such as electron spin, nuclear magnetic moment, and nuclear quadrupole moment in high sensitivity, allows the probe 2 of the atomic force microscope to approach the surface of the test sample 1, applies a magnetic field to the test sample 1 by the magnetic field generation coil 27 and the magnetic paths 22 to 26 and furthermore a high frequency electromagnetic field to the test sample 1 by the coils 16 and 17 respectively, and detects a signal from atoms existing on the surface of the test sample 1 which are resonant with the high frequency electromagnetic field by the probe 2.
REFERENCES:
patent: 4733182 (1988-03-01), Clarke et al.
patent: 4851762 (1989-07-01), Kim et al.
patent: 5166615 (1992-11-01), Sidles
patent: 5266896 (1993-11-01), Rugar et al.
patent: 5298863 (1994-03-01), Nowak
patent: 5319977 (1994-06-01), Quate et al.
patent: 5410910 (1995-05-01), Samlyo et al.
patent: 5412322 (1995-05-01), Wollin
Manassen et al., "Electron Spin Resonance-Scanning Tunneling Microscopy Experiments on Thermally Oxidized Si(111)," Physical Review B, vol. 48, No. 7, Aug. 15, 1993, pp. 4887-4890.
Manassen et al., "Direct Observation of the Precession of Individual Paramagnetic Spins on Oxidized Silicon Surfaces," Physical Review Letters, vol. 62, No. 21, May 22, 1989, pp. 2531-2534.
Zuger et al., "First Images from a Magnetic Resonance Force Microscope," Applied Physics Letters, 63 (18), Nov. 1, 1993, pp. 2496-2498.
Rugar et al., "Mechanical Detection of Magnetic Resonance," Letters to Nature, vol. 360, Dec. 10, 1992, pp. 563-566.
Hasegawa Tsuyoshi
Hosoki Shigeyuki
Kohno Makiko
Hitachi , Ltd.
Mah Raymond Y.
Tokar Michael
LandOfFree
Apparatus for measuring physical properties of micro area does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for measuring physical properties of micro area, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for measuring physical properties of micro area will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1994097