Apparatus for measuring parasitic capacitance and inductance...

Details Apparatus for measuring parasitic capacitance and inductance... Apparatus for measuring parasitic capacitance and inductance...

2007-11-13

2007-11-13

Dinh, Tuan (Department: 2841)

Electricity: conductors and insulators

Conduits, cables or conductors

Preformed panel circuit arrangement

C174S265000, C257S737000

Reexamination Certificate

active

10367490

ABSTRACT:
Apparatus is provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.

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