Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1987-10-27
1990-01-02
Karlsen, Ernest F.
Electricity: measuring and testing
Plural, automatically sequential tests
324 57N, 324 57R, 324158P, G01R 3102, G01R 2700, G01R 106
Patent
active
048915777
ABSTRACT:
A device for measuring characteristics of a semiconductor device using a noise measurement system and an impedance measuring system includes an input probe and an output probe for providing connection to the semiconductor device. The device also includes first and second variable impedance devices for respectively varying a source and a load impedance, and respectively connected to the input and output probing devices. First and second switching devices are respectively connected to the first and second variable impedance devices. The switching devices selectively connect the first and second variable impedance devices to the noise measurement system, and selectively connect the first and second variable impedance devices to the impedance measuring system.
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patent: 4207518 (1980-06-01), Hopfer
patent: 4419626 (1983-12-01), Cedrone et al.
patent: 4697143 (1987-09-01), Lockwood et al.
patent: 4740746 (1988-04-01), Pollock et al.
patent: 4764723 (1988-08-01), Strid
"tuners--Coaxial: Slide Screw Tuners", Maury Microwave Corporation.
"WPH-300; WPH-305; 40 GHz Wafer Probes", Cascade Microtech.
Technical Data Apr. 1987, Yokogawa Hewlett Packard, Models 8970S/T, 8970B, 8971B, and 346A/B/C; pp. 1-15.
Technical Data Jul. 1987, Yokogawa Hewlett Packard, Model HP8510B; pp. 6-7 and 10-11.
Karlsen Ernest F.
Matsushita Electric - Industrial Co., Ltd.
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