Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-12-18
2000-05-23
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, 356360, G01B 902
Patent
active
060671610
ABSTRACT:
An apparatus for determining a thickness profile of a moving material having at least two optical interfaces. A transport apparatus transports a length of moving material at a predetermined flatness through a measurement region. A recessed track disposed in the channel provides an area of non-contact in the measurement region. An interferometer apparatus collects a portion of a beam of light reflected from the optical interfaces of the moving length and generates an interference signal representative of the collected light. An analyzer then analyzes the interference signal to determine a thickness profile of the material in the first direction.
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patent: 5731876 (1998-03-01), Venkatesh et al.
Harris Harry W.
Kelbe Richard R.
Lee Jiann-Rong
Marcus Michael A.
Eastman Kodak Company
Kim Robert H.
Parulski Susan L.
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