Apparatus for measuring magnetostriction constant

Electricity: measuring and testing – Magnetic – Stress in material measurement

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324232, G01B 724, G01R 3312, G01N 2772

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active

043107982

ABSTRACT:
Direct method for measuring the magnetostriction constant .lambda..sub.s of soft magnetic and isotropic magnetic materials. A thin film sample is cantilevered and clamped at one edge. Under the influence of a magnetic AC field and the magnetostriction effect of the sample material, the free end of the cantilevered sample is deflected and oscillates with twice the frequency of the AC field. The resonance amplitude a.sub.res is measured by using a laser beam impinging upon the oscillating sample and measuring the reflected beam amplitude by means of a position-sensitive photodiode. The AC output signal of the photodiode is proportional to the sample amplitude. The magnetostriction constant .lambda..sub.s is directly proportional to the resonance amplitude a.sub.res multiplied by a constant factor which depends on known geometry and properties of the sample material.

REFERENCES:
patent: 2596752 (1952-05-01), Williams
patent: 3901074 (1975-08-01), Douglas
Hoffmann et al., "Measurements of the Magnetostriction Constant of Thin NiFe Films" Z. Agnew Phys. vol. 26, No. 2, 1969 pp. 141-145.
Klokholm, "The Measurment of Magnetostriction in Ferromagnetic Thin Film" IEEE Transaction on Magnetics, vol. MAG-12, No. 6, 1976 pp. 819-821.
Hoekstra et al., "Magnetostriction. . . Coating Field. . . " Rev. Sci. Inst. vol. 48, No. 10, 10-1977, pp. 1253-1255.

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