Optics: measuring and testing – By polarized light examination
Patent
1997-04-17
1998-10-13
Font, Frank G.
Optics: measuring and testing
By polarized light examination
356369, G01J 400
Patent
active
058220631
ABSTRACT:
An apparatus for measuring magneto-optical effect includes a light source 102, a spectroscope 120, a first polarizer 150 to polarize the light with a required wavelength taken out by the spectroscope 120, means 172 for applying magnetic field on a sample 176, a second polarizer 156 to admit the light transmitted or reflected by a sample 176 to pass, a photo-detector 162 for detecting intensity of light that has passed the second polarizer 156. The light source 102 includes a heavy hydrogen lamp and the spectroscope does not contain a lens and/or prism. A light path from the light source to the photo-detector is housed in a container, and the container is filled with a gas containing no oxygen.
REFERENCES:
patent: 5278630 (1994-01-01), Maruyama
Magnetooptical Kerr Spectrometer for 1.2-5.9 eV Region and its Application to FePt/Pt Multilayers, Jpn. J. Appl. Phys., vol. 32 (1993), pp. 989-995.
Suzuki Takao
Van Drent William
Font Frank G.
Merlino Amanda
Toyota Jidosha & Kabushiki Kaisha
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