Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-05-05
1983-11-01
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
250231R, 250231SE, 250578, B01B 1114
Patent
active
044127456
ABSTRACT:
A light image of a scale, which bears length or angle information recorded in the form of a bright and dark bit pattern, is projected onto the light receiving surface of a storage effect type sensor, whereby a charge pattern data corresponding to the projected image is formed. Before the regular read-out of the charge pattern data thus formed from the sensor, the sensor is scanned at least once at a higher scanning frequency than the frequency for the regular data read-out. From the data thus read out, read-out data that obtained in the absence of illumination light is subtracted, and the resultant data which is free from error component is processed to obtain a final measurement of the length or angle.
REFERENCES:
patent: 3973119 (1976-08-01), Renes et al.
patent: 4074258 (1978-02-01), Dore et al.
patent: 4301471 (1981-11-01), Holscher et al.
patent: 4340819 (1982-07-01), Ogasawara et al.
Kimura Kazuaki
Ohtomo Fumio
Punter William H.
Tokyo Kogaku Kikai K. K.
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