Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1990-05-03
1991-08-27
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351211, 351221, A61B 310
Patent
active
050429388
ABSTRACT:
A measuring apparatus has a model eye for measuring a distance from a first objective surface to a second objective surface, an observation optical system for observing an interference between reflected light flux from the model eye and reflected light flux from the object eye, and a light flux split member for splitting light flux and guiding coherent split light flux to both the object eye and the model eye. The model eye is provided with at least a first surface corresponding to the first objective surface and a second surface corresponding to the second objective surface. The interference fringe between the first surface and the first objective surface being observed, and the interference fringe between the second surface and the second objective surface is in order to measure the length of a visual line as a distance from the first objective surface to the second objective surface (eye axial length), the depth of the anterior chamber, the thickness of a crystal lens, etc.
REFERENCES:
patent: 4820037 (1989-04-01), Kohayakawa
A. F. Fercher et al., Optics Letter, vol. 13, No. 3, pp. 186-188, Mar. 1988, Optical Society of America, "Eye-Length Measurement by Interferometry with Partially Coherent Light".
Bovernick Rodney B.
Kabushiki Kaisha Topcon
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