Apparatus for measuring jitter and method of measuring jitter

Pulse or digital communications – Testing – Phase error or phase jitter

Reexamination Certificate

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C375S224000, C375S316000

Reexamination Certificate

active

07460592

ABSTRACT:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, having a signal converting section for calculating a spectrum of the signal-under-measurement, a bandwidth calculating section for calculating frequency where a saturation rate of a value of the integrated spectrum of the signal-under-measurement becomes almost equal to a saturation rate set in advance in a band-to-be-measured set in advance as upper cutoff frequency of the band-to-be-measured to calculate the jitter and a jitter calculating section for measuring the jitter in the signal-under-measurement based on the spectaum in the band-to-be-measured of the signal-under-measurement.

REFERENCES:
patent: 5818872 (1998-10-01), Gupta
patent: 6246717 (2001-06-01), Chen et al.
patent: 6400129 (2002-06-01), Yamaguchi et al.
patent: 6460001 (2002-10-01), Yamaguchi et al.
patent: 6621860 (2003-09-01), Yamaguchi et al.
patent: 6775321 (2004-08-01), Soma et al.
patent: 6795496 (2004-09-01), Soma et al.
patent: 6898535 (2005-05-01), Draving
patent: 6922439 (2005-07-01), Yamaguchi et al.
patent: 6934648 (2005-08-01), Hanai et al.
patent: 6990417 (2006-01-01), Yamaguchi et al.
patent: 7054358 (2006-05-01), Yamaguchi et al.
patent: 7203229 (2007-04-01), Ishida et al.
patent: 7206340 (2007-04-01), Jungerman et al.
patent: 7254168 (2007-08-01), Guenther
patent: 2002/0159514 (2002-10-01), Miyoshi et al.
patent: 2002/0163958 (2002-11-01), Yamaguchi et al.
patent: 2003/0125888 (2003-07-01), Yamaguchi et al.
patent: 2003/0202573 (2003-10-01), Yamaguchi et al.
patent: 2004/0062301 (2004-04-01), Yamaguchi et al.
patent: 2004/0146097 (2004-07-01), Jungerman et al.
patent: 2005/0031029 (2005-02-01), Yamaguchi et al.
patent: 2005/0080574 (2005-04-01), Draving
patent: 2005/0185708 (2005-08-01), Yamaguchi et al.
patent: 2005/0232345 (2005-10-01), Ward et al.
patent: 2005/0267696 (2005-12-01), Yamaguchi et al.
patent: 2005/0286627 (2005-12-01), Tabatabaei
patent: 2006/0018418 (2006-01-01), Ichiyama et al.
patent: 2006/0133469 (2006-06-01), Froelich et al.
patent: 2006/0182170 (2006-08-01), Ichiyama et al.
patent: 2006/0229836 (2006-10-01), Stephens
M. Lauterbach and T. Wey, Analyze Jitter to Improve High-Speec Design, IEEE Spectrum, pp. 62-67, Jul. 2000.

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