Apparatus for measuring electron temperature

Details Apparatus for measuring electron temperature Apparatus for measuring electron temperature

1989-04-06

1991-07-09

Dixon, Joseph L.

Boots, shoes, and leggings

374163, G01K 1100

Patent

active

050311255

ABSTRACT:
Apparatus for measuring the electron temperature of plasma includes a first probe which is inserted in the plasma to detect the floating potential. Two sequentially generated pulses of distinct voltages are added to the detected floating potential and these summed voltages are then sequentially applied to the plasma via a second probe. The current in the second probe is detected and the electron temperature is then calculated from the values of the voltage pulses and the currents detected by the second probe.

REFERENCES:
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patent: 4607962 (1986-08-01), Nagao et al.
patent: 4852027 (1989-07-01), Bowman et al.
Dr. Irving Langmuir and Harold Mott-Smith, Jr., General Electric Review vol. XXVII, No. 7 Jul. 1924, pp. 449-455, "Studies of Electric Discharges in Gases at Low Pressures".

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