Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2006-12-12
2006-12-12
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S649000, C324S12300R, C600S547000
Reexamination Certificate
active
07148701
ABSTRACT:
The present invention provides an apparatus for measuring electrical impedance comprising: two input electrodes contacted to a subject for measuring impedance; a difference amplifier to which two signals inputted to the two input electrodes are inputted; a device for extracting a common mode component of two signals inputted to the two input electrodes; the third electrode contacted to the subject for measuring impedance; the first multiplier to which the common mode component is inputted; the first filter coupled with the first multiplier; the second multiplier coupled with the first filter; wherein a feedback signal outputted from the second multiplier is inputted to the third electrode.
REFERENCES:
patent: 5544662 (1996-08-01), Saulnier et al.
patent: 6208888 (2001-03-01), Yonce
patent: 6232834 (2001-05-01), Zheng
patent: 6265978 (2001-07-01), Atlas
patent: 6292690 (2001-09-01), Petrucelli et al.
patent: 6373264 (2002-04-01), Matsumoto et al.
patent: 6631292 (2003-10-01), Liedtke
patent: 6720828 (2004-04-01), Nelson et al.
patent: 6804992 (2004-10-01), Goodman et al.
patent: 6885752 (2005-04-01), Chabries et al.
patent: 6925325 (2005-08-01), Yonce
patent: 2004/0002662 (2004-01-01), Hjelt et al.
patent: 2005/0113712 (2005-05-01), Petrucelli
ITC-CSCC 2003 Final Program (The 2003 International Technical Conference on Circuits/Systems, Computers and Communications, Jul. 7-9, 2003, Phoenix Park, Kang-Wong Do, Korea.
ITC-CSCC 2003 Proceedings (The 2003 International Technical Conference on Circuits/Systems, Computers and Communications, Jul. 7-9, 2003, Phoenix Park, Kang-Won Do, Korea.
IEEK Summer Conference 2003, Jul. 9-10, 2003, Phoenix Park, Kang-Won Do, Korea.
IEEK Summer Conference 2003 Proceedings, Jul. 9-10, 2003, Phoenix Park, Kang-Woo Do, Korea.
Hwang In-Duk
Park Sin-Chong
Alston & Bird LLP
Deb Anjan
Information and Communication University In-Duk Hwang
Kramskaya Marina
Research and Industrial Cooperation Group
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