Apparatus for measuring eccentricity of optical module

Details Apparatus for measuring eccentricity of optical module Apparatus for measuring eccentricity of optical module

2006-09-12

2009-12-01

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C356S497000

Reexamination Certificate

active

07627449

ABSTRACT:
An exemplary apparatus (100) for measuring eccentricity of an optical module (23) includes a worktable (10), an image sensor device (17), a driving device (13), and a processing device (19). The worktable is configured for supporting the optical module. The image sensor device is configured for receiving an image of the optical module. The driving device is configured for driving rotation of the worktable. The processing device is connected to the image sensor device, and the processing device is configured for analyzing the image of the optical module.

REFERENCES:
patent: 5757486 (1998-05-01), Marcus et al.
patent: 6275298 (2001-08-01), Marcus
patent: 2003/0107789 (2003-06-01), Hishioka
patent: 11-94700 (1999-04-01), None
patent: 3597302 (2004-12-01), None
Yijie Niu et al., “Study on Measurement System of Centering Errors”, Electric Measuring Technology, the fifth issue, pp. 5-6, published on Oct. 31, 2005 in China.

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