Apparatus for measuring dimensions of a slit

Details Apparatus for measuring dimensions of a slit Apparatus for measuring dimensions of a slit

1986-02-07

1987-05-12

Haroian, Harry N.

Geometrical instruments

Gauge

Internal

33143L, 33147N, G01B 700

Patent

active

046638580

ABSTRACT:
A slit measurement device (10) is provided for taking various measurements of slit thickness along the slit's length. The device (10) includes a thin elongated probe (14) that is insertable into the slit (18) and which has a wide but flat end portion (26). The probe (14) is rotated in both a clockwise and counter-clockwise direction with rotation in both directions being constrained by the slit's walls (66,68). The total amount of rotation is used to calculate slit thickness.

REFERENCES:
patent: 4345380 (1982-08-01), Vis
patent: 4489497 (1984-12-01), Schemel
patent: 4554742 (1985-11-01), Freitag

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