Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1979-06-15
1981-11-03
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
356394, 356398, G01B 1124, G01B 1100
Patent
active
042982855
ABSTRACT:
An apparatus for measuring contour configuration of articles, particularly brittle articles such as ceramic honeycombs without touching them comprising a turn table on which the article to be measured is placed, a rotary encoder mechanically coupled to the turn table for producing a rotational angle signal representing a rotational position of the article on the turn table, an edge detector including a parallel light projecting member and a parallel light receiving member, those members being arranged on respective sides of the turn table in such a manner that a part of the parallel light is shielded or cut by the article and an edge position signal is produced, a memory for storing a standard edge position signal which will be produced by the edge detector when a standard article having given dimensions placed on the turn table is scanned during a single rotation thereof, and an operation circuit for receiving the rotational angle signal from the rotary encoder, the edge position signal from the edge detector and the standard edge position signal from the memory and comparing these edge position signals under the control of the rotational angle signal to produce a deviation of contour configuration of the article from the standard article.
REFERENCES:
patent: 3566135 (1971-02-01), Mouchart
patent: 4064534 (1977-12-01), Chen et al.
patent: 4122525 (1978-10-01), Eaton
Reich et al., "High Speed Profile Measurement With Electro-Optics", Optical Engineering, vol. 15, 1,2-76, pp. 44-47.
NGK Insulators Ltd.
Punter William H.
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