Apparatus for measuring coating thickness on an applicator roll

Coating apparatus – With indicating – testing – inspecting – or measuring means

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Details

250577, 356381, B05C 108, B05C 1110, H01J 3912, G01N 2128

Patent

active

041822595

ABSTRACT:
An apparatus and method are disclosed for measuring the amounts of a coating material on an applicator roll. A beam of light is projected so that only a first portion thereof is intercepted by the coating material on the applicator roll. At least a fraction of the remaining light portion passes through an aperture defined by a slotted shield member and the coated roll surface, said fraction varying with the thickness of said material on the roll surface, and detector means disposed to measure said variable fraction.

REFERENCES:
patent: 2371259 (1945-03-01), Patterson
patent: 2951416 (1960-09-01), Shinn
patent: 2971461 (1961-02-01), Bradford et al.
patent: 3130303 (1964-04-01), Dobbins
patent: 3190261 (1965-06-01), Ziffer
patent: 3330961 (1967-07-01), Juengst et al.
patent: 3378676 (1968-04-01), Clement
patent: 3809907 (1974-05-01), Schuller et al.
patent: 3844870 (1974-10-01), Donoghue et al.
patent: 4030836 (1977-06-01), Smith
patent: 4035635 (1977-07-01), Crosland et al.

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