Electricity: measuring and testing – Using ionization effects – For analysis of gas – vapor – or particles of matter
Patent
1989-08-08
1991-12-03
Wieder, Kenneth A.
Electricity: measuring and testing
Using ionization effects
For analysis of gas, vapor, or particles of matter
324 714, 356336, G01N 2762
Patent
active
050703005
ABSTRACT:
Apparatus for measuring breakdown plasma, comprising an irradiating device for irradiating a sample with a focused light beam and for causing breakdown of a ultrafine particle to be measured in the sample at the focused beam region to change the particle into plasma; a pair of electrodes arranged on opposite sides of the focused region of the beam; and a device for measuring an electrical resistance between the electrodes under a condition where the breakdown plasma is produced between the electrodes and for determining a diameter of the particle according to the measured electrical resistance serves for accurate measurement of the diameter of the ultrafine particle in the sample.
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patent: 3853750 (1974-12-01), Volsy
patent: 3953792 (1976-04-01), Fletcher
patent: 4662749 (1987-05-01), Hatton et al.
patent: 4722602 (1988-02-01), Kitamori et al.
patent: 4767591 (1988-08-01), Wampler
Tellus (Journal of Geo Physics), 1966 pp. 573-586 Electric Aerosol Particle Counting and Size Distribution Measuring, Whitby et al.
Kitamori Takehiko
Matsui Tetsuya
Sakagami Masaharu
Yokose Kenji
Hitachi , Ltd.
Regan Maura K.
Wieder Kenneth A.
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