Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1992-07-27
1995-04-11
Czaja, Donald E.
Optics: measuring and testing
By polarized light examination
With polariscopes
356364, 356365, G01J 400
Patent
active
054063710
ABSTRACT:
In order to efficiently obtain data for calculating retardation values at a plurality of wavelengths, a sample having birefringence is placed between a polarizer and an analyzer, which are maintained in a parallel nicol relation to each other and rotated about an optical axis of measuring light. White measuring light is applied through the polarizer so that the light being passed through the sample and transmitted through the analyzer is received by a polychromator. A one-dimensional optical sensor is arranged on an outgoing imaging surface of the polychromator, to simultaneously detect transmitted light intensity values of a plurality of wavelengths. Since transmitted light intensity values of a plurality of wavelengths are obtained every polarization rotation angle of the polarizer and the analyzer, it is possible to obtain dispersion of retardation values with respect to wavelengths and the like by processing the data.
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Nagata Shin-ichi
Sakai Kiyokazu
Tajima Yo
Tomita Osamu
Cano Milton I.
Czaja Donald E.
Klima William L.
New Oji Paper Co. Ltd.
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